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Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs (Invited Paper)

Author(s):
Dambrine, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Raynaud, C. ( STMicroelectronics (France) )
Vanmackelberg, M. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Danneville, F. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Pailloncy, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Lepilliet, S. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
Raskin, J.P. ( Univ. Catholique de Louvain (Belgium) )
2 more
Publication title:
Noise in Devices and Circuits
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5113
Pub. date:
2003
Page(from):
105
Page(to):
119
Pages:
15
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
Language:
English
Call no.:
P63600/5113
Type:
Conference Proceedings

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