Compact modeling of noise for RF CMOS circuit simulation (Invited Paper)

Compact modeling of noise for RF CMOS circuit simulation (Invited Paper)

Author(s):

Scholten, A.J. ( Philips Research Labs. (Netherlands) )

Tiemeijer, L.F. ( Philips Research Labs. (Netherlands) )

Van Langevelde, R. ( Philips Research Labs. (Netherlands) )

Havens, R.J. ( Philips Research Labs. (Netherlands) )

Zegers-van Duijnhoven, A.T.A.Z. ( Philips Research Labs. (Netherlands) )

de Kort, R. ( Philips Research Labs. (Netherlands) )

Venezia, V.C. ( Philips Research Leuven (Belgium) )

Klaassen, D.B.M. ( Philips Research Labs. (Netherlands) )

3 more

Publication title:

Noise in Devices and Circuits

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5113

Pub. Year:

2003

Page(from):

93

Page(to):

104

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449733 [0819449733]

Language:

English

Call no.:

P63600/5113

Type:

Conference Proceedings

Details

TDL ID:	ZA00013101
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Fluctuations and Noise : Noise in Devices and Circuits
Conf. info. (Number):	2003
Conf. info. (Venue):	Santa Fe, NM, USA
Conf. info. (Date):	2003.06.02-2003.06.04

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