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Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors

Author(s):
Publication title:
Noise in Devices and Circuits
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5113
Pub. date:
2003
Page(from):
44
Page(to):
55
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
Language:
English
Call no.:
P63600/5113
Type:
Conference Proceedings

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