Blank Cover Image

Microstructures of defects causing noise in MOS devices (Invited Paper)

Author(s):
Fleetwood, D.M. ( Vanderbilt Univ. (USA) )  
Publication title:
Noise as a Tool for Studying Materials
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5112
Pub. Year:
2003
Page(from):
259
Page(to):
270
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449726 [0819449725]
Language:
English
Call no.:
P63600/5112
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings 1/f noise in SOI buried oxides and alternative dielectrics to Si02 (Invited Paper)

Fleetwood, D. M., Xiong, H. D., Lin, J. S.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings Space lidar mission concepts for climate studies (Invited Paper)

Winker,D.M.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Hydrogen Model for Negative Bias Temperature Instabilities in MOS Gate Dielectrics

Fleetwood, D.M., Zhou, X.J., Tsetseris, L., Pantelides, S.T., Schrimpf, R.D.

Electrochemical Society
8 Conference Proceedings Recent radiation issues in silicon-on-insulator devices

Alles, M.L., Ball, D.R., Schrimpf, R.D., Fleetwood, D.M., Reed, R.A., Jun, B.

Electrochemical Society
3 Conference Proceedings Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors

Xiong, H.D., Fleetwood, D.M., Schwank, J.R.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Characteristic potential method of noise calculation in semiconductor devices: calculation of 1/f noise in MOS transistors in the ohmic region (Invited Paper)

Hong, S., Kim, Y., Min, H.S., Park, Y.J.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Novel device structures based on colloidal photonic crystals (Invited Paper)

Rengarajan, R., Prasad, T., Colvin, V.L., Mittleman, D.M.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Photonic crystal devices (Invited Paper)

O'Brien, J. D., Kuang, W., Shih, M. -H., Bagheri, M., Cao, J. R., Choi, S. J., Dapkus, P. D.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Nanoscale MOS devices: device parameter fluctuations and low-frequency noise (Invited Paper)

Wong, H., Iwai, H., Liou, J. J.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Defects in MOS Technologies

Korytar,D., Kavicky,P., Hulman,M., Weissensteiner,A., Tuchscher,L.

Trans Tech Publications
6 Conference Proceedings Technician education and training: a plan for systemic change (Invited Paper)

Hull, D.M.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Generation-recombination noise in GaN and GaN-based devices (Invited Paper)

Pala, N., Rumyantsev, S.L., Shur, M.S., Levinshtein, M.E., Khan, M.A., Simin, G.S., Gaska, R.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12