Denoising using higher-order statistics

Denoising using higher-order statistics

Author(s):

Kozaitis, S.P. ( Florida Institute of Technology (USA) )
Kim, S.

Publication title:

Independent Component Analyses, Wavelets, and Neural Networks

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5102

Pub. Year:

2003

Page(from):

37

Page(to):

44

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449627 [0819449628]

Language:

English

Call no.:

P63600/5102

Type:

Conference Proceedings

Details

TDL ID:	ZA00013091
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Independent Component Analyses, Wavelets, and Neural Networks
Conf. info. (Number):	2003
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2003.04.22-2003.04.25

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