Raman and scanning electron microscopy measurements of RDX on glass substrates

Raman and scanning electron microscopy measurements of RDX on glass substrates

Author(s):

Torres, P. ( Univ. of Puerto Rico at Mayaguez (USA) )

Mercado, L.

Mortimer, L.

Mina, N.

Hernandez-Rivera, S.P.

Lareau, R.T. ( Transportation Security Administration (USA) )

Chamberlain, R.T.

Castro, M.E. ( Univ. of Puerto Rico at Mayaguez (USA) )

3 more

Publication title:

Detection and Remediation Technologies for Mines and Minelike Targets VIII

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5089

Pub. Year:

2003

Vol.:

2

Pt.:

Session 25

Page(from):

1054

Page(to):

1064

Pages:

11

Pub. info.:

Bellingham, WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449498 [0819449490]

Language:

English

Call no.:

P63600/5089

Type:

Conference Proceedings

Details

TDL ID:	ZA00013077
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Detection and Remediation Technologies for Mines and Minelike Targets
Conf. info. (Number):	2003 : 8th
Conf. info. (Venue):	Orlando, Florida, USA
Conf. info. (Date):	2003.04.21-2003.04.25
Note for article:	Session 25. Chemical Sensing III ; 5089-117

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