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Analysis of short-wavelength recording properties of AgInSbTe thin films

Author(s):
  • Wei, J. ( Shanghai Institute of Optics and Fine Mechanics (China) )
  • Ruan, H. ( Shanghai Institute of Optics and Fine Mechanics (China) )
  • Gan, F. ( Shanghai Institute of Optics and Fine Mechanics (China) )
Publication title:
Sixth International Symposium on Optical Storage (ISOS 2002)
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5060
Pub. Year:
2003
Page(from):
167
Page(to):
170
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448668 [0819448664]
Language:
English
Call no.:
P63600/5060
Type:
Conference Proceedings

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