Micro-electromechanically informed phenomenological constitutive models for ferroelectrics

Micro-electromechanically informed phenomenological constitutive models for ferroelectrics

Author(s):

Landis, C.M. ( Rice Univ. (USA) )
Wang, J. ( Rice Univ. (USA) )
Sheng, J. ( Rice Univ. (USA) )

Publication title:

Smart structures and materials 2003 : Active materials : Behavior and mechanics : 3-6 March 2003, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5053

Pub. Year:

2003

Page(from):

335

Page(to):

346

Pages:

12

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448583 [0819448583]

Language:

English

Call no.:

P63600/5053

Type:

Conference Proceedings

Details

TDL ID:	ZA00013044
Series ID:	PA00000029
Conf. info. (Name):	Smart Structures and Materials
Conf. info. (Number):	2003
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.03.03-2003.03.06

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