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Damage estimation method using committee of neural networks

Author(s):
  • Yun, C.B. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Lee, J.W. ( Korea Institute of Machinery and Materials (South Korea) )
  • Kim, J.D. ( Korea Institute of Machinery and Materials (South Korea) )
  • Min, K.W. ( Dankook Univ. (South Korea) )
Publication title:
Smart Nondestructive Evaluation and Health Monitoring of Structural and Biological Systems II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5047
Pub. Year:
2003
Page(from):
263
Page(to):
274
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448521 [0819448524]
Language:
English
Call no.:
P63600/5047
Type:
Conference Proceedings

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