Blank Cover Image

In situ measurements of stress-corrosion crack growth using laser ultrasonics

Author(s):
Publication title:
Testing, Reliability, and Application of Micro- and Nano-Material Systems
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5045
Pub. Year:
2003
Page(from):
213
Page(to):
222
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448507 [0819448508]
Language:
English
Call no.:
P63600/5045
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Noncontact NDE of microscopic surface-breaking cracks using laser generated and detected ultrasonic surface waves

Cooney, A., Blackshire, J.L.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings Interferometric assessment of laser-induced damage to semiconductors

Blackshire, J.L., Zakel, A., Guha, S.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Microcharacterization of MEMS ultrasonic transducers using laser interferometry

Blackshire, J.L., Sathish, S.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings In Situ Measurements of Grain Growth and Recrystallization by Laser Ultrasonics

M. Militzer, T. Garcin, W.J. Poole

Trans Tech Publications
3 Conference Proceedings Characterization of microscopic surface breaking cracks using the near-field intensification of nondestructive laser-generated surface waves

Cooney, A.T., Blackshire, J.L.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Stress-Corrosion Cracking

Scully, J. C.

American Chemical Society
4 Conference Proceedings Optical interferometric measurements of the static/dynamic response characteristics of MEMS ultrasonic transducers

Blackshire, J.L., Sathish, S.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Measurement of charge carrier decay rates in bulk indium arsenide and mercury cadmium telluride wafers

Guha,S., Blackshire,J.L., Zakel,A., Kishnamurthy,S.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Laser processing of micro-cracks for structural life extension

Blackshire, J.L., Dosser, L., Hix, K.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings In-Situ Observations of Intergranular Stress Corrosion Cracking

Jonathan A. Duff, Thomas J. Marrow

American Society of Mechanical Engineers
6 Conference Proceedings Microscopic NDE of hidden corrosion

Blackshire, J.L., Hoffmann, J., Kropas-Hughes, C.V., Tansel, I.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Full-field detection of surface defects using real-time holography and optical correlation techniques

Blackshire,J.L., Duncan,B.D.

SPIE - The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12