Failure prediction across process window for robust OPC
- Author(s):
Shang, S.D. ( Mentor Graphics Corp. (USA) ) Granik, Y. ( Mentor Graphics Corp. (USA) ) Cobb, N.B. ( Mentor Graphics Corp. (USA) ) Maurer, W. ( Mentor Graphics Corp. (USA) ) Cui, Y. ( IBM Corp. (USA) ) Liebmann, L.W. ( IBM Corp. (USA) ) Oberschmidt, J.M. ( IBM Corp. (USA) ) Singh, R.N. ( IBM Thomas J. Watson Research Ctr. (USA) ) Vampatella, B.R. ( IBM Corp. (USA) ) - Publication title:
- Optical Microlithography XVI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5040
- Pub. Year:
- 2003
- Vol.:
- Part One
- Page(from):
- 431
- Page(to):
- 440
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448453 [0819448451]
- Language:
- English
- Call no.:
- P63600/5040
- Type:
- Conference Proceedings
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