Full-level alternating PSM for sub-100nm DRAM gate patterning
- Author(s):
Pforr, R. ( Infineon Technologies AG (Germany) ) Ahrens, M. ( Infineon Technologies AG (Germany) ) Dettmann, W. ( Infineon Technologies AG (Germany) ) Hennig, M. ( Infineon Technologies AG (Germany) ) Koehle, R. ( Infineon Technologies AG (Germany) ) Ludwig, B. ( Infineon Technologies AG (Germany) ) Morgana, N. ( Infineon Technologies AG (Germany) ) Thiele, J. ( Infineon Technologies AG (Germany) ) - Publication title:
- Optical Microlithography XVI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5040
- Pub. Year:
- 2003
- Vol.:
- Part One
- Page(from):
- 232
- Page(to):
- 243
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448453 [0819448451]
- Language:
- English
- Call no.:
- P63600/5040
- Type:
- Conference Proceedings
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