Blank Cover Image

Enhancement measurement of pulmonary nodules with multirow detector CT: precision assessment of a 3D algorithm compared to the standard procedure

Author(s):
Wormanns, D. ( Univ. of Munster (Germany) )
Klotz, E. ( Siemens Medical Solutions (Germany) )
Kohl, G. ( Siemens Medical Solutions (Germany) )
Dregger, U. ( Univ. of Munster (Germany) )
Diederich, S. ( Univ. of Munster (Germany) )
Fischbach, R. ( Univ. of Munster (Germany) )
Heindel, W. ( Univ. of Munster (Germany) )
2 more
Publication title:
Medical Imaging 2003: Image Processing
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5032
Pub. Year:
2003
Vol.:
Part Two
Page(from):
795
Page(to):
801
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819448330 [0819448338]
Language:
English
Call no.:
P63600/5032
Type:
Conference Proceedings

Similar Items:

Wormanns, D., Kohl, G., Klotz, E., Heindel, W., Diederich, S.

SPIE-The International Society for Optical Engineering

F. Beyer, S. Diederich, W. Heindel, D. Wormanns

SPIE - The International Society of Optical Engineering

Wormanns, D., Klotz, E., Dregger, U., Beyer, F., Heindel, W.

SPIE - The International Society of Optical Engineering

Fiebich,M., Wietholt,C., Renger,B.C., S.G.Armato ?, Hoffmann,K.R., Wormanns,D., Diederich,S.

SPIE - The International Society for Optical Engineering

Wormanns,D., Fiebich,M., Wietholt,C., Diederich,S., Heindel,W.

SPIE - The International Society for Optical Engineering

Wormanns, D, Beyer, F, Butzbach, A, Zierott, L, Heindel, W

SPIE - The International Society of Optical Engineering

Wormanns,D., Fiebich,M., Saidi,M., Diederich,S., Heindel,W.

SPIE-The International Society for Optical Engineering

Fan, L., Qian, J., Odry, B., Shen, H., Naidich, D., Kohl, G., Klotz, E.

SPIE-The International Society for Optical Engineering

Fiebich,M., Wormanns,D., Heindel,W.

SPIE-The International Society for Optical Engineering

McNitt-Gray,M.F., Wyckoff,N., Goldin,J.G., Suh,R., Sayre,J.W., Aberle,D.R.

SPIE-The International Society for Optical Engineering

Beyer, F., Wormanns, D., Diederich, S., Ludwig, K., Heindel, W.

SPIE - The International Society of Optical Engineering

Beyer, F, Zierott, L, Fallenberg, E M, Juergens, K, Stoeckel J, Heindel, W, Wormanns, D

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12