Blank Cover Image

Entangled exciton states in quantum dot molecules (Invited Paper)

Author(s):
Bayer, M. ( Univ. Wuerzburg and Univ. Dortmund (Germany) )
Ortner, G. ( Univ. Wuerzburg and Univ. Dortmund (Germany) )
Larionov, A. ( Univ. Wuerzburg (Germany) )
Kress, A. ( Univ. Wuerzburg (Germany) )
Forchel, A.W.B. ( Univ. Wuerzburg (Germany) )
Hawrylak, P. ( National Research Council (Canada) )
Hinzer, K. ( National Research Council (Canada) )
Korkusinski, M. ( National Research Council (Canada) )
Fafard, S. ( National Research Council (Canada) )
Wasilewski, Z.R. ( National Research Council (Canada) )
Reinecke, T.L. ( Naval Research Lab. (USA) )
Lyanda-Geller, Yu. ( Naval Research Lab. (USA) )
7 more
Publication title:
10th International Symposium on Nanostructures: Physics and Technology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5023
Pub. Year:
2003
Page(from):
522
Page(to):
525
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448248 [0819448249]
Language:
English
Call no.:
P63600/5023
Type:
Conference Proceedings

Similar Items:

Bayer, M., Stern, O., Forchel, A., Hawrylak, P., Fafard, S., Hinzer, K., Narvaez, G., Wasilewski, Z.

Materials Research Society

Schneiber, M., Seufert, J., Schoemig, H., Bacher, G., Forchel, A.W.B.

SPIE-The International Society for Optical Engineering

Hinzer,K., Bayer,M., Stern,O., Gorbunov,A., Forchel,A.W., Hawrylak,P., Lapointe,J.M., Fafard,S.

SPIE-The International Society for Optical Engineering

Forchel,A.W.B., Reithmaier,J.P., Schater,F., Kamp,M., Bayer,M.

SPIE - The International Society for Optical Engineering

Borri, P., Langbein, W., Schneider, S., Woggon, U., Schwab, M., Bayer, M., Sellin, R.L., Ouyang, D., Bimberg, D., …

SPIE - The International Society of Optical Engineering

Liu, H.C., Fafard, S., Dudek, R., Wasilewski, Z.R.

SPIE-The International Society for Optical Engineering

4 Conference Proceedings Quantum dot devices

Fafard,S., Liu,H.C., Wasilewski,Z.R., McCaffrey,J.P., Spanner,M., Raymond,S., Allen,C.Ni., Hinzer,K., Lapointe,J.M., …

SPIE - The International Society for Optical Engineering

Sek,G., Ryczko,K., Misiewicz,J., Bayer,M., Klopf,F., Reithmaier,J.P., Forchel,A.W.B.

SPIE-The International Society for Optical Engineering

Bayer,M., Braun,W., Baars,T., Forchel,A., Reinecke,T.L., Walck,S.N., Schmitt,O.M., Banyai,L., Haug,H.

SPIE-The International Society for Optical Engineering

Reigzenstein, S, Sek., G, Loffler, A, Hofmann, C, Kuhn, S, Reithmaier, J. P., Keldysh, L. V., Kulakovskii, V. D, …

SPIE - The International Society of Optical Engineering

Raymond, S.(Invited Speaker), Studenikin, S., Sachrajda, A., Wasilewski, Z., Cheng, S.J., Sheng, W., Hawrylak, P., …

Electrochemical Society

Bryja,L., Ryczko,K., Kubisa,M., Misiewicz,J., Stern,O., Bayer,M., Forchel,A.W.B., Sorensen,C.B.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12