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Raman studies as a tool for characterization of the strained hexagonal GaN/AlxGa1-xN superlattices

Author(s):
Davydov, V.Yu. ( A.F. Ioffe Physico-Technical Institute (Russia) )
Smirnov, A.N. ( A.F. Ioffe Physico-Technical Institute (Russia) )
Goncharuk, I.N. ( A.F. Ioffe Physico-Technical Institute (Russia) )
Kyutt, R.N. ( A.F. Ioffe Physico-Technical Institute (Russia) )
Scheglov, M.P. ( A.F. Ioffe Physico-Technical Institute (Russia) )
Baidakova, M.V. ( A.F. Ioffe Physico-Technical Institute (Russia) )
Lundin, W.V. ( A.F. Ioffe Physico-Technical Institute (Russia) )
Zavarin, E.E. ( A.F. Ioffe Physico-Technical Institute (Russia) )
Smirnov, M.B. ( St. Petersburg State Univ. (Russia) )
Karpov, S.V. ( St. Petersburg State Univ. (Russia) )
Harima, H. ( Kyoto Institute of Technology (Japan) )
6 more
Publication title:
10th International Symposium on Nanostructures: Physics and Technology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5023
Pub. Year:
2003
Page(from):
146
Page(to):
149
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448248 [0819448249]
Language:
English
Call no.:
P63600/5023
Type:
Conference Proceedings

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