Statistical characterization of detail preservation

Statistical characterization of detail preservation

Author(s):

Huttunen, H. ( Tampere Univ. of Technology (Finland) )
Koivisto, P.T. ( Tampere Univ. of Technology (Finland) )
Niemistoe, A. ( Tampere Univ. of Technology (Finland) )
Yli-Harja, O.P. ( Tampere Univ. of Technology (Finland) )

Publication title:

Image processing : algorithms and systems II : 21-23 January 2003, Santa Clara, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5014

Pub. Year:

2003

Page(from):

66

Page(to):

77

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448149 [0819448141]

Language:

English

Call no.:

P63600/5014

Type:

Conference Proceedings

Details

TDL ID:	ZA00012997
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Image processing : algorithms and systems
Conf. info. (Number):	2003 : 2nd
Conf. info. (Venue):	Santa Clara, CA, USA
Conf. info. (Date):	2003.01.21-2003.01.23

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