Tunnel profile measurement by vision metrology toward application to NATM
- Author(s):
- Hattori, S. ( Fukuyama Univ. (Japan) )
- Akimoto, K. ( Shikoku Polytech College (Japan) )
- Ono, T. ( Kyoto Univ. (Japan) )
- Miura, S. ( Kajima Technical Research Institute (Japan) )
- Publication title:
- Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5011
- Pub. Year:
- 2003
- Page(from):
- 50
- Page(to):
- 58
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448118 [0819448117]
- Language:
- English
- Call no.:
- P63600/5011
- Type:
- Conference Proceedings
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