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Comparative analysis of advanced poly-silicon thin-film transistor architectures for drain field relief (Invited Paper)

Author(s):
Fortunato, G. ( IFN-CNR (Italy) )
Valletta, A. ( IFN-CNR (Italy) )
Bonfiglietti, A. ( IFN-CNR (Italy) )
Cuscuna, M. ( IFM-CNR (Italy) )
Gaucci, P. ( IFN-CNR (Italy) )
Mariucci, L. ( IFN-CNR (Italy) )
Pecora, A. ( IFN-CNR (Italy) )
Brotherton, S.D. ( Philips Research Labs. (United Kingdom) )
Ayres, J.R. ( Philips Research Labs. (United Kingdom) )
4 more
Publication title:
Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5004
Pub. Year:
2003
Page(from):
150
Page(to):
164
Pages:
15
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448040 [0819448044]
Language:
English
Call no.:
P63600/5004
Type:
Conference Proceedings

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