Reliability and failure mechanisms of oxide VCSELs in non-hermetic enviroments
- Author(s):
Xie, S. ( Agilent Technologies, Inc. (USA) ) Herrick, R.W. ( Agilent Technologies, Inc. (USA) ) Brabander, G.N.D. ( Agilent Technologies, Inc. (USA) ) Widjaja, W.H. ( Agilent Technologies, Inc. (USA) ) Koelle, U. ( Agilent Technologies, Inc. (USA) ) Cheng, A.-N. ( Agilent Technologies, Inc. (USA) ) Giovane, L.M. ( Agilent Technologies, Inc. (USA) ) Hu, F.Z. ( Agilent Technologies, Inc. (USA) ) Keever, M.R. ( Agilent Technologies, Inc. (USA) ) Osentowski, T. ( Agilent Technologies, Inc. (USA) ) McHugo, S.A. ( Agilent Technologies, Inc. (USA) ) Mayonte, M.S. ( Agilent Technologies, Inc. (USA) ) Kim, S.M. ( Agilent Technologies, Inc. (USA) ) Chamberlin, D.R. ( Agilent Technologies, Inc. (USA) ) Rosner, S.J. ( Agilent Technologies, Inc. (USA) ) Girolami, G. ( Agilent Technologies, Inc. (USA) ) - Publication title:
- Vertical-Cavity Surface-Emitting Lasers VII
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4994
- Pub. Year:
- 2003
- Page(from):
- 173
- Page(to):
- 180
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447944 [0819447943]
- Language:
- English
- Call no.:
- P63600/4994
- Type:
- Conference Proceedings
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