Characterization of failure mechanisms for oxide VCSELs (Invited Paper)

Characterization of failure mechanisms for oxide VCSELs (Invited Paper)

Author(s):

McHugo, S.A. ( Agilent Technologies (USA) )

Krishnan, A. ( Agilent Technologies (USA) )

Krueger, J.J. ( Agilent Technologies (USA) )

Luo, Y. ( Agilent Technologies (USA) )

Tan, N.-X. ( Agilent Technologies (USA) )

Osentowski, T. ( Agilent Technologies (USA) )

Xie, S. ( Agilent Technologies (USA) )

Mayonte, M.S. ( Agilent Technologies (USA) )

Herrick, R.W. ( Agilent Technologies (USA) )

Deng, Q. ( Agilent Technologies (USA) )

Heidecker, M. ( Agilent Technologies (USA) )

Eastley, D. ( Agilent Technologies (USA) )

Keever, M.R. ( Agilent Technologies (USA) )

Kocot, C.P. ( Agilent Technologies (USA) )

9 more

Publication title:

Vertical-Cavity Surface-Emitting Lasers VII

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4994

Pub. Year:

2003

Page(from):

55

Page(to):

66

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447944 [0819447943]

Language:

English

Call no.:

P63600/4994

Type:

Conference Proceedings

Details

TDL ID:	ZA00012977
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Vertical-cavity surface-emitting lasers
Conf. info. (Number):	2003 : 7th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2003.01.29-2003.01.30

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