Reliability of 1.3 micron VCSELs for metro area networks (Invited Paper)

Reliability of 1.3 micron VCSELs for metro area networks (Invited Paper)

Author(s):

Prakash, S.R. ( Optical Communication Products (USA) )

Chirovsky, L.M.F. ( Optical Communication Products (USA) )

Naone, R.L. ( Optical Communication Products (USA) )

Galt, D. ( Optical Communication Products (USA) )

Kisker, D.W. ( Optical Communication Products (USA) )

Jackson, A.W. ( Optical Communication Products (USA) )

1 more

Publication title:

Vertical-Cavity Surface-Emitting Lasers VII

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4994

Pub. Year:

2003

Page(from):

44

Page(to):

54

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447944 [0819447943]

Language:

English

Call no.:

P63600/4994

Type:

Conference Proceedings

Details

TDL ID:	ZA00012977
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Vertical-cavity surface-emitting lasers
Conf. info. (Number):	2003 : 7th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2003.01.29-2003.01.30

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