Blank Cover Image

Self-consistent numerical modeling of gain and amplified spontaneous emission in semiconductor optical amplifiers

Author(s):
  • Palmier, J.F. ( Consultant (France) )
  • Trenado, N. ( OPTO+ Alcatel Research and Innovation (France) )
  • Dagens, B. ( OPTO+ Alcatel Research and Innovation (France) )
  • Lapere, V. ( OPTO+ Alcatel Research and Innovation (France) )
Publication title:
Physics and Simulation of Optoelectronic Devices XI
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4986
Pub. Year:
2003
Page(from):
393
Page(to):
404
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447869 [0819447862]
Language:
English
Call no.:
P63600/4986
Type:
Conference Proceedings

Similar Items:

B. S. G. Pillai, K. L. Lee, A. Nirmalathas, M. Premaratne, C. Lim

SPIE - The International Society of Optical Engineering

Fan,H., Wu,C., Dutta,N.K., Koren,U., Chen,C.H., Piccirilli,A.B.

SPIE - The International Society for Optical Engineering

Shen,Y., Ng,J.H., Chen,Z., Liu,D., Lu,C., Rao,M.K.

SPIE-The International Society for Optical Engineering

Qi, G., Yao, J., Seregelyi, J., Paquet, S., Belisle, J.C.

SPIE - The International Society of Optical Engineering

Archundia, L. C., Resan, B., Delfyett, P. J.

SPIE - The International Society of Optical Engineering

Loeser, M., Occhi, L., Laino, V., Witzigmann, B.

SPIE - The International Society of Optical Engineering

P. Fournier, B.P. Orsal, J.-M. Peransin, E. Lefranc

Society of Photo-optical Instrumentation Engineers

Flicstein,J., Mba,J., Solliec,J.-M.Le, Palmier,J.F.

SPIE-The International Society for Optical Engineering

P. Fournier, B.P. Orsal, J.-M. Peransin, R.M. Alabedra

Society of Photo-optical Instrumentation Engineers

Teixeira, A.L.J., Lima, M.J.N., Andre, P.S.B., Oliveira, F., Rocha, J.R.F.

SPIE-The International Society for Optical Engineering

Jones, D.C., Scott, A.M.

SPIE - The International Society of Optical Engineering

Li, X., Alexandropoulos, D., Adams, M.J., Lealman, I.F.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12