Microscopic spectral imaging using mid-infrared semiconductor lasers

Microscopic spectral imaging using mid-infrared semiconductor lasers

Author(s):

Guo, B. ( Photonic Device and System Labs./Univ. of Houston (USA) )
Wang, Y. ( Photonic Device and System Labs./Univ. of Houston (USA) )
Peng, C. ( Photonic Device and System Labs./Univ. of Houston (USA) )
Luo, G.-P. ( Photonic Device and System Labs./Univ. of Houston (USA) )
Le, H.Q. ( Photonic Device and System Labs./Univ. of Houston (USA) )

Publication title:

Spectral Imaging: Instrumentation, Applications, and Analysis II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4959

Pub. Year:

2003

Page(from):

1

Page(to):

11

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819447593 [0819447595]

Language:

English

Call no.:

P63600/4959

Type:

Conference Proceedings

Details

TDL ID:	ZA00012943
Series ID:	PA00000029
Conf. info. (Name):	SPIE BiOS : Spectral imaging
Conf. info. (Number):	2003 : 2nd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2003.01.26

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