Blank Cover Image

Detection of glaucomatous retinal nerve fiber layer damage by scanning laser polarimetry with custom corneal compensation

Author(s):
Zhou, Q. ( Laser Diagnostic Technologies, Inc. (USA) )
Reed, J. ( Laser Diagnostic Technologies, Inc. (USA) )
Betts, R.W. ( Laser Diagnostic Technologies, Inc. (USA) )
Trost, P.K. ( Laser Diagnostic Technologies, Inc. (USA) )
Lo, P.-W. ( Laser Diagnostic Technologies, Inc. (USA) )
Wallace, C. ( Laser Diagnostic Technologies, Inc. (USA) )
Bienias, R.H. ( Laser Diagnostic Technologies, Inc. (USA) )
Li, G. ( Laser Diagnostic Technologies, Inc. (USA) )
Winnick, R. ( Laser Diagnostic Technologies, Inc. (USA) )
Papworth, W.A. ( Laser Diagnostic Technologies, Inc. (USA) )
Sinai, M. ( Laser Diagnostic Technologies, Inc. (USA) )
6 more
Publication title:
Ophthalmic Technologies XIII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4951
Pub. Year:
2003
Page(from):
32
Page(to):
41
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819447517 [081944751X]
Language:
English
Call no.:
P63600/4951
Type:
Conference Proceedings

Similar Items:

Zhou, Q., Trost, P.K., Lo, P.-W., Hitzenberger, C.K.

SPIE - The International Society of Optical Engineering

Rockwell,B.A., Payne,D.J., Hopkins,R.A., Hammer,D.X., Kennedy,P.K., Amnotte,R.E., Eilert,B., Druessel,J.J., Toth,C.A., …

SPIE-The International Society for Optical Engineering

B.A. Rockwell, P.K. Kennedy, R.J. Thomas, W.P. Roach, M.E. Rogers

Society of Photo-optical Instrumentation Engineers

Kennedy, P.K., Zuclich, J.A., Lund, D.J., Edsall, P.R., Till, S., Stuck, B.E., Hollins, R.C.

SPIE - The International Society of Optical Engineering

3 Conference Proceedings Ultrashort-laser-pulse retinal damage

Rockwell,B.A., Roach,W.P., Payne,D.J., Kennedy,P.K., Druessel,J.J., Amnotte,R.E., Eilert,B., Phillips,S.L., …

SPIE-The International Society for Optical Engineering

Zuclich,J.A., Lund,D.J., Edsall,P.R., Hollins,R.C., Smith,P.A., Stuck,B.E., McLin,L.N., Kennedy,P.K., Till,S.J.

SPIE - The International Society for Optical Engineering

Rockwell,B.A., Toth,C.A., Roach,W.P., Payne,D.J., Hopkins,R.A.,Jr., Kennedy,P.K., Stolarski,D.J., Noojin,G.D., …

SPIE - The International Society for Optical Engineering

Kennedy,P.K., Druessel,J.J., Cupello,J.M., Till,S., Gerstman,B.S., Thompson,C.R., Rockwell,B.A.

SPIE-The International Society for Optical Engineering

Janiec,S., Rzendkowski,M., Gierek-Ciaciura,S., Szymkowiak,M., Momot-Kawalska,B.

SPIE - The International Society for Optical Engineering

Rockwell,B.A., Toth,C.A., Stolarski,D.J., Noojin,G.D., Kennedy,P.K., Shaver,J.H., Buffington,G.D., Thomas,R.J.

SPIE-The International Society for Optical Engineering

Hitzenberger, C.K., Trost, P., Lo, P.-W., Zhou, Q.

SPIE - The International Society of Optical Engineering

Zwick,H., Lund,D.J., Elliott,R., Schuschereba,S.T., Edsall,P.R.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12