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Improved beam quality due to current profiling in a broad-area semiconductor laser

Author(s):
Houlihan, J.A. ( National Univ. of Ireland/Cork (Ireland) )
Voignier, V. ( National Univ. of Ireland/Cork (Ireland) )
O'Callaghan, J.R. ( National Univ. of Ireland/Cork (Ireland) )
Wu, G. ( National Univ. of Ireland/Cork (Ireland) )
Huyet, G. ( National Univ. of Ireland/Cork (Ireland) )
McInerney, J.G. ( Novalux, Inc. (USA) )
Corbett, B. ( National Microelectronics Research Ctr. (Ireland) )
2 more
Publication title:
Laser Diodes, Optoelectronic Devices, and Heterogenous Integration
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4947
Pub. Year:
2003
Page(from):
261
Page(to):
269
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447425 [0819447420]
Language:
English
Call no.:
P63600/4947
Type:
Conference Proceedings

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