Henley,M.V., Bradley,W.R., Wyatt,S.E., Graziano,G.M., Wells,J.R.
SPIE - The International Society for Optical Engineering
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M. Yates, J. C. Martin, P. Ávila, F. J. Gil-Llambias
Elsevier
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Donohue, M. D., Geiger, J. L., Kiamos, A. A., Nielsen, K. A.
American Chemical Society
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Cha, Chang Y.
American Institute of Chemical Engineers
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Yates, M., Blanco, J., Luengo, M.A. Martin
Elsevier
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Laritcheva, O.O., Semenov, S.Yu., Smirnov, V.N., Tananikyn, N.I.
Kluwer Academic Publishers
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Culp, R.A., Legato, J.M., Otero, E.
American Chemical Society
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M. Campbell, W.X. Peng, K.W.D. Ledingham, A. Marshall, R.P. Singhal
Society of Photo-optical Instrumentation Engineers
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LaReg ina, J. E., Bozzelli, J. W., Harkov, R., Giante, S. J., Jr.
American Institute of Chemical Engineers
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P.A. David, R.E. Pauls, E.H. Baughman
Society of Photo-optical Instrumentation Engineers
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A. Niedojadlo, K. H. Becker, Y. Elshorbany, R. Kurtenbach, P. Wiesen, A. Schady, A. Zwozdziak, J. Zwozdziak
Springer
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S.M. Illingworth, J.J. Remedios, H. Boesch
ESA Communications
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