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Extrinsic Surface Photovoltage Spectroscopy - An Alternative Approach to Deep Level Characterisation in Semiconductors

Author(s):
Publication title:
Photovoltaic and photoactive materials - properties, technology and applications
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
80
Pub. Year:
2002
Page(from):
317
Page(to):
320
Pages:
4
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISBN:
9781402008238 [1402008236]
Language:
English
Call no.:
N17050/80
Type:
Conference Proceedings

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