Analytical Design Methodology of a Novel Drift-Layer for Super-Junction Power MOSFET: CoolMOS
- Author(s):
- Publication title:
- Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001)
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4746
- Pub. Year:
- 2002
- Vol.:
- VOL-2
- Page(from):
- 1304
- Page(to):
- 1306
- Pages:
- 3
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445001 [0819445002]
- Language:
- English
- Call no.:
- P63600/4746
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Breakdown Voltage and On Resistance of Super-Junction Power MOSFET : CooIMOSTM
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Narosa Publishing House |
8
Conference Proceedings
Irradiation Effects of 1 MeV Electrons and 50 MeV Heavy Ions on P-N Junction Silicon Diodes and N-/P-Channel Power MOSFETs
SPIE - The International Society for Optical Engineering |
Narosa Publishing House |
9
Conference Proceedings
Short Circuit Robustness of 1200 V SiC Junction Transistors and Power MOSFETs
Trans Tech Publications |
Trans Tech Publications |
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Analytical Methodology and Design of Advanced Test Structure for the Mechanical Characteristics of Microactuator Materials
MRS - Materials Research Society |
Electrochemical Society |
6
Conference Proceedings
IMPROVED NEAR SURFACE HEAVY IMPURITY DETECTION BY A NOVEL CHARGED PARTICLE ENERGY FILTER TECHNIQUE
MRS - Materials Research Society |
North Holland |