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Effect of Gate Profile on the Characteristics of 0.5μm GaAs MESFETs

Author(s):
Naik, A.A.
Rawal, D.S.
Prabhakar, S.
Sai Saravanan, G.
Sehgal, B.K.
Gulati, R.
Vyas, H.P.
Kumar, Rajesh
Suryanarayana, P.
Rao, A.V.S.K.
Govindacharyulu, P.A.
6 more
Publication title:
Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001)
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4746
Pub. Year:
2002
Vol.:
VOL-2
Page(from):
1148
Page(to):
1151
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445001 [0819445002]
Language:
English
Call no.:
P63600/4746
Type:
Conference Proceedings

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