3D profiles of scratches on optical disks and their effect on a bit engine

3D profiles of scratches on optical disks and their effect on a bit engine

Author(s):

Zhong, J.Y. ( Philips Research East Asia (China) )
den Hollander, J.M. ( Philips Research Labs. (Netherlands) )
Goossens, H.
Guo, Z.J. ( Philips Research East Asia (China) )
Zhang, J.G.

Publication title:

Advanced optical storage technology : 15-18 October, 2002, Shanghai, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4930

Pub. Year:

2002

Page(from):

180

Page(to):

185

Pages:

6

Pub. info.:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447197 [0819447196]

Language:

English

Call no.:

P63600/4930

Type:

Conference Proceedings

Details

TDL ID:	ZA00012779
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Advanced optical storage technology
Conf. info. (Number):	2002
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2002.10.15-2002.10.18

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