Real-time weld defect inspection system in x-ray images
- Author(s):
- Sun, Y. ( Dalian Univ. of Technology (China) )
- Wang, E.L.
- Zhou, P.
- Li, M.
- Publication title:
- Optical information processing technology : 16-18 October 2002, Shanghai, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4929
- Pub. Year:
- 2002
- Page(from):
- 282
- Page(to):
- 287
- Pages:
- 6
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447180 [0819447188]
- Language:
- English
- Call no.:
- P63600/4929
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Technological improvements on the image quality in the low-intensity x-ray real-time imaging system
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Scheme of real-time Dammann grating based miniaturized three-dimensional endoscopic imaging system
Society of Photo-optical Instrumentation Engineers |
8
Conference Proceedings
Real-time signal processing system for noncontact measurement of liquid-level position
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Research on the image multilayer matching comparison method in PCB defects inspection
Society of Photo-optical Instrumentation Engineers |
9
Conference Proceedings
Real-time surface defects inspection of steel strip based on difference image
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
An intelligent system for real time automatic defect inspection on specular coated surfaces [5960-147]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Real-time image registration algorithms based on region of interest [6027-137]
SPIE - The International Society of Optical Engineering |