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Real-time weld defect inspection system in x-ray images

Author(s):
Publication title:
Optical information processing technology : 16-18 October 2002, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4929
Pub. Year:
2002
Page(from):
282
Page(to):
287
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447180 [0819447188]
Language:
English
Call no.:
P63600/4929
Type:
Conference Proceedings

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