Pattern recognition for optical PSI images of surface topography using wavelets
- Author(s):
- Jiang, X.Q. ( Huazhong Univ. of Science and Technology (China) )
- Xiao, S.J.
- Blunt, L.
- Publication title:
- Optical information processing technology : 16-18 October 2002, Shanghai, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4929
- Pub. Year:
- 2002
- Page(from):
- 149
- Page(to):
- 157
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447180 [0819447188]
- Language:
- English
- Call no.:
- P63600/4929
- Type:
- Conference Proceedings
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