Blank Cover Image

Optimum baffle design of star sensor

Author(s):
  • Lu, W. ( Institute of Optics and Electronics (China) )
  • Li, Z.
Publication title:
Optical design and testing : 15-18 October 2002, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4927
Pub. date:
2002
Page(from):
374
Page(to):
380
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447166 [0819447161]
Language:
English
Call no.:
P63600/4927
Type:
Conference Proceedings

Similar Items:

Arnoux,J.-J.P.

SPIE-The International Society for Optical Engineering

B. Li, Y. Zhang, H. Li, C. Wang

SPIE - The International Society of Optical Engineering

Y. Li, L. Li, Y. Huang, J. Liu

Society of Photo-optical Instrumentation Engineers

Xie, H., Xu, J. F., Li, H. F., Sun, C. H., Jin, S. Z., Ai, G. X.

SPIE - The International Society of Optical Engineering

Yan,S., Lu,H., Zhou,W., Luo,W., Yang,H.

SPIE-The International Society for Optical Engineering

Gao, R.X., Wang, C., Sheng, S.W.

SPIE - The International Society of Optical Engineering

Luhong Zhang, Xiaoming Xiao, Li Hao

American Institute of Chemical Engineers

Lu, W., Zhang, Z., Yu, X., Li, M.

SPIE - The International Society of Optical Engineering

Li, Lu Feng

Trans Tech Publications

Wang,W., Li,X., Lu,D.

SPIE-The International Society for Optical Engineering

Kawano, H., Sato, Y., Mitani, K., Kanai, H., Hama, K.

SPIE-The International Society for Optical Engineering

J. Li, Y. Lu, J. Calusdian, X. Yun, M. Meyyappan

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12