Aliasing phenomenon in EBCCD imaging

Aliasing phenomenon in EBCCD imaging

Author(s):

Zuo, F. ( Beijing Institute of Technology (China) )
Gao, Z.Y.
Liu, G.R.
Su, M.K.
Zhou, L.W.

Publication title:

Electronic imaging and multimedia technology III : 15-17 October, 2002, Shanghai, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4925

Pub. Year:

2002

Page(from):

598

Page(to):

603

Pages:

6

Pub. info.:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447142 [0819447145]

Language:

English

Call no.:

P63600/4925

Type:

Conference Proceedings

Details

TDL ID:	ZA00012774
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Electronic imaging and multimedia technology
Conf. info. (Number):	2002 : 3rd
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2002.10.15-2002.10.17

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