Blank Cover Image

Minimum resolvable contrast (MRC) study for CCD low-light-level imaging system

Author(s):
Publication title:
Electronic imaging and multimedia technology III : 15-17 October, 2002, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4925
Pub. Year:
2002
Page(from):
591
Page(to):
597
Pages:
7
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447142 [0819447145]
Language:
English
Call no.:
P63600/4925
Type:
Conference Proceedings

Similar Items:

Wang, L.X., Jin, W.Q., Gao, Z.Y., Liu, G.R.

SPIE-The International Society for Optical Engineering

Wang, X., Gao, Z.Y., Zhang, J.Y., Jin, W.Q.

SPIE-The International Society for Optical Engineering

Sui, J., Jin, W., Zhang, J., Zhou, Y.

SPIE - The International Society of Optical Engineering

Su, B.H., Jin, W.Q., Niu, L.H., Liu, G.R.

SPIE-The International Society for Optical Engineering

He, Y.Q., Jin, W.Q., Wang, X., Gao, Z.Y., Wang, L.X., Liu, G.R.

SPIE-The International Society for Optical Engineering

Zhou, Y., Jin, W., Xie, F., Zhang, J.

SPIE - The International Society of Optical Engineering

He, Y.Q., Jin, W.Q., Liu, G.R., Gao, Z.Y., Wang, X., Wang, L.X.

SPIE-The International Society for Optical Engineering

10 Conference Proceedings Aliasing phenomenon in EBCCD imaging

Zuo, F., Gao, Z.Y., Liu, G.R., Su, M.K., Zhou, L.W.

SPIE-The International Society for Optical Engineering

Wang, S.X., Gao, Z.Y., Jin, W.Q., Hou, S.F.

SPIE-The International Society for Optical Engineering

J. Wang, W. Jin, Y. He, L. Wang

Society of Photo-optical Instrumentation Engineers

Zhang, J.Y., Jin, W.Q., Hu, W.J., Wang, X.

SPIE-The International Society for Optical Engineering

Zhang, J., Jin, W., Li, S., Zhou, Y.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12