Temperature and strain measurements using the power, line-width, shape, and frequency shift of the Brillouin loss spectrum (Invited Paper)

Temperature and strain measurements using the power, line-width, shape, and frequency shift of the Brillouin loss spectrum (Invited Paper)

Author(s):

Bao, X.Y. ( Univ. of Ottawa (Canada) )
Smith, J. ( Univ. of New Brunswick (Canada) )
Brown, A.W.

Publication title:

Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4920

Pub. Year:

2002

Page(from):

311

Page(to):

322

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447098 [0819447099]

Language:

English

Call no.:

P63600/4920

Type:

Conference Proceedings

Details

TDL ID:	ZA00012769
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Advanced Sensor Systems and Applications
Conf. info. (Number):	2002
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2002.10.15-2002.10.18

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