New MCP reflection x-ray sensitive film of variable-density halide
- Author(s):
Dan, T.R. ( Changchun Univ. of Science and Technology (China) ) Tian, J.Q. Sun, X.P. Li, Y. Niu, J.B. Jiang, D.L. Duanmu, Q.D. Fu, L.C. - Publication title:
- Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4919
- Pub. Year:
- 2002
- Page(from):
- 401
- Page(to):
- 404
- Pages:
- 4
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447081 [0819447080]
- Language:
- English
- Call no.:
- P63600/4919
- Type:
- Conference Proceedings
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