Influence of confined layer on characteristics of current density and carrier diffusion in VCSEL

Influence of confined layer on characteristics of current density and carrier diffusion in VCSEL

Author(s):

Duan, X.F. ( Ordnance Engineering College (China) )
Zhang, C.
Zhou, B.
Xu, C.M.

Publication title:

Semiconductor Lasers and Applications

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4913

Pub. Year:

2002

Page(from):

194

Page(to):

198

Pages:

5

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447029 [0819447021]

Language:

English

Call no.:

P63600/4913

Type:

Conference Proceedings

Details

TDL ID:	ZA00012762
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Semiconductor lasers and applications
Conf. info. (Number):	2002
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2002.10.15-2002.10.17

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