Blank Cover Image

Base-band all-optical ether with its demonstration

Author(s):
Lin, D.-C. ( Chunghwa Telecom Co. Ltd. (Taiwan China) )
Chiang, Y.-H.
Lu, M.-K.
Yeh, T.-C.
Liu, Y.-L.
Lin, K.-H.
Chiang, P.-W.
Liao, H.-H.
3 more
Publication title:
Metro and access networks II : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-17 October, 2002, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4908
Pub. Year:
2002
Page(from):
101
Page(to):
104
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446978 [0819446971]
Language:
English
Call no.:
P63600/4908
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Nonlinear all-optical phase and power-controlled switch by using the spatial soliton interaction

Wu, Y.-D., Liao, Y.-F., Chen, M.-H., Chiang, K.-H.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings SWS grating for UV band filter by nano-imprint

J.-S. Lin, K.-H. Liao, C.-T. Chen, C.-L. Lai, C.-H. Ko

Society of Photo-optical Instrumentation Engineers
2 Conference Proceedings Model-based OPC for node random size contact hole with SRAF [6154-129]

Huang, C. W., Chang, Y. Y., Yeh, L. S., Liao, H. Y., Shih, C. L., Lin, J. P.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Influence of crosstalk on all-optical system

Wu, Q., Yu, C.X., Lin, M., Liu, J.P., Wang, T.Z.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Contact-hole process window improved by assistant features with FLEX function on KrF [6154-90]

Chiang, C. K., Yeh, L S., Wu, W.B., Shih, C. L, Lin, J. P.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings A high-resolution contamination-mode inspection method providing a complete solution to the inspection challenges for advanced photomasks

Bhattacharyya, K., Huang, Y.-T., Son, K., Wang, D., Liu, L., Liao, C.H., Dai, Y.-M., Lin, J.-C.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings A new all-optical phase-controlled routing switch

Wu, Y.-D., Hsiao, M.-C., Chen, M.-H., Chiang, K.-H.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings High-resolution reticle inspection technique providing a complete reticle qualification solution in advanced 90-nm node wafer fabs

Liu, L., Liao, C.-H., Dai, Y.-M., Lin, J.-C., Bhattacharyya, K., Huang, Y.-T., Son, K., Wang, D.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Near-field optical characterization of visible multiple quantum well semiconductor lasers

Lu,N.H., Tsai,D.P., Yeh,F.C., Chang,C.S., Tsong,T.T., Huang,M.F., Liu,C.J.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Feasibility of improving CD-SEM-based APC system for exposure tool by spectroscopic-ellipsometry-based APC system

Lin, W., Liao, S., Tsai, R., Yeh, M., Hsieh, C., Yu, Y., Lin, B. S., Fu, S., Dziura, T. G.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings A novel electric current sensor employing twisted optical fibers

Chen, M.-H., Chiang, K.-H., Wu, Y.-D., Lin, W.-W., Wu, T.-W.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Design and investigation of an all-optical WDM ring network

Veen,D.T.van, Rikkers,E., Krommendijk,F., Sikken,B., Krijnen,G.J.M., Linders,P.W.C., Bakher,A.F., Joppe,J.L., …

SPIE - The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12