Optical multiple-correlation system for pattern recognition

Optical multiple-correlation system for pattern recognition

Author(s):

Matsuoka, K. ( National Institute of Advanced Industrial Science and Technology (Japan) )

Minomo, T. ( Osaka Science and Technology Ctr. (Japan) )

Yotsuya, T.

Kasai, I, ( Minolta Co. Ltd. (Japan) )

Onoda, H. ( Kanebo, Ltd. (Japan) )

Ueno, A. ( Cosina Co., Ltd. (Japan) )

1 more

Publication title:

Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4902

Pub. Year:

2002

Page(from):

660

Page(to):

669

Pages:

10

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446893 [0819446890]

Language:

English

Call no.:

P63600/4902

Type:

Conference Proceedings

Details

TDL ID:	ZA00012751
Series ID:	PA00000029
Conf. info. (Name):	Optomechatronic Technologies : Optomechatronic Systems
Conf. info. (Number):	2002 : 3rd
Conf. info. (Venue):	Stuttgart, Germany
Conf. info. (Date):	2002.11.12-2002.11.14

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