Blank Cover Image

Managing and distributing remote sensing images based on metadata and microimage

Author(s):
Publication title:
Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4898
Pub. Year:
2003
Page(from):
49
Page(to):
56
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446848 [081944684X]
Language:
English
Call no.:
P63600/4898
Type:
Conference Proceedings

Similar Items:

Deng, X., Li, X., Wang, C., Yu, R.

SPIE - The International Society of Optical Engineering

Qin, K., Guan, Z., Li, D., Wang, X.Z.

SPIE - The International Society of Optical Engineering

L. Lei, Y. Su, Z. Li

Society of Photo-optical Instrumentation Engineers

Li, X., Deng, X., Niu, Z., Ye, F.

SPIE - The International Society of Optical Engineering

W. Huang, J. Wang, X. Song, C. Zhao, L. Liu

Society of Photo-optical Instrumentation Engineers

S. Li, L. M. Wang, H. Deng

ESA Communications

Su,L., Huang,Y., Li,X.

SPIE-The International Society for Optical Engineering

Jiang, D., Li, L., Hou, X., Wang, H., Gao, Z., Yang, J., Li, J.

SPIE - The International Society of Optical Engineering

Li, D., Li, L., Yu, X.

SPIE - The International Society of Optical Engineering

Z. Wang, Y. Zhang, Z. Geng, X. Sui, B. Li

Society of Photo-optical Instrumentation Engineers

Zhang, X., Li, D., Li, J.

SPIE - The International Society of Optical Engineering

T. Liu, P. Li, L. Zhang, X. Chen

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12