Low-defect EUVI multilayers on standard-format mask blanks

Low-defect EUVI multilayers on standard-format mask blanks

Author(s):

Folta, J.A. ( Lawrence Livermore National Lab. (USA) )

Kearney, P.A.

Larson, C.C.

Crosley, M.K.

Fisch, E. ( IBM Microelectronics Div. (USA) )

Racette, K.C.

1 more

Publication title:

22nd Annual BACUS Symposium on Photomask Technology

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4889

Pub. Year:

2002

Vol.:

Part One

Page(from):

374

Page(to):

381

Pages:

8

Pub. info.:

Bellingham, WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446756 [0819446750]

Language:

English

Call no.:

P63600/4889

Type:

Conference Proceedings

Details

TDL ID:	ZA00012736
Series ID:	PA00000029
Conf. info. (Name):	SPIE Photomask Technology : Annual BACUS Symposium on Photomask Technology
Conf. info. (Number):	2002 : 22nd
Conf. info. (Venue):	Monterey, California, USA
Conf. info. (Date):	2002.10.011-2002.10.04

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