Back to square 9: a demonstration of 9-in. reticle capability
- Author(s):
Cummings, K.D. ( ASML (USA) ) Schneider-Stoermann, L.U. ( Schott Lithotec AG (Germany) ) Buttgereit, U. Irmscher, M. ( Institut fuer Mikroelektronik Stuttgart (Germany) ) Mueller, D. Hudek, P. ( Leica Microsystems Lithography GmbH (Germany) ) Beyer, D. Brendel, B. Whittey, J.M. Eynon, B.G. ( Photronics Inc. (USA) ) Harsch, J. Constantine, C. ( Unaxis USA, Inc. (USA) ) Miller, K. ( Veeco Instruments (USA) ) - Publication title:
- 22nd Annual BACUS Symposium on Photomask Technology
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4889
- Pub. Year:
- 2002
- Vol.:
- Part One
- Page(from):
- 15
- Page(to):
- 24
- Pages:
- 10
- Pub. info.:
- Bellingham, WA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819446756 [0819446750]
- Language:
- English
- Call no.:
- P63600/4889
- Type:
- Conference Proceedings
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