Masiello,G., Serio,C., Viggiano,M.
SPIE-The International Society for Optical Engineering
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Tashkun,S.A., Golovko,V.F., Chursin,A.A., Aoki,T., Fukabori,M., Zakharov,V.I., Gribanov,K.G.
SPIE - The International Society for Optical Engineering
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Jiang, D., Dong, C., Lu, W.
SPIE - The International Society of Optical Engineering
|
D.A. Montera, B.M. Welsh, M.C. Roggemann, D.W. Ruck
Society of Photo-optical Instrumentation Engineers
|
Amato,U., De Feis,I., Serio,C.
SPIE-The International Society for Optical Engineering
|
De Feis, I., Lubrano, A.M., Serio, C.
SPIE-The International Society for Optical Engineering
|
Cuomo V., Amato U., Rizzi R., Serio C., Tramutoli U.
Springer-Verlag
|
Serio, B., Hunsinger, J. J., Conseil, F., Derderian, P., Collard, D., Buchaillot, L., Ravat, M. F.
SPIE - The International Society of Optical Engineering
|
Feis,I.De, Lubrano,A.M., Masiello,G., Serio,C.
SPIE-The International Society for Optical Engineering
|
A. C. Vandaele, M. Kruglanski, M. De Mazière
ESA Publications Division
|
X. Liu, D. K. Zhou, A. Larar, W. L. Smith, P. Schluessel
Society of Photo-optical Instrumentation Engineers
|
A. C. Vandaele, M. Kruglanski, M. De Mazière
ESA Publications Division
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