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Analysis of material properties for MEMS using interferometric measurements

Author(s):
  • O'Mahony, C. ( National Microelectronics Research Ctr. (Ireland) )
  • Hill, M. ( Cork Institute of Technology (Ireland) )
  • Mathewson, A. ( National Microelectronics Research Ctr. (Ireland) )
Publication title:
Opto-Ireland 2002: Optics and Photonics Technologies and Applications
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4876
Pub. Year:
2003
Vol.:
Part Two
Page(from):
712
Page(to):
722
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446572 [0819446572]
Language:
English
Call no.:
P63600/4876
Type:
Conference Proceedings

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