Optimized design and simulation of electrical capacitance sensor for electrical capacitance tomography system

Optimized design and simulation of electrical capacitance sensor for electrical capacitance tomography system

Author(s):

Chen, D. Y. ( Harbin Univ. of Science and Technology (China) )
Zheng, G. B.
Yang, C. J.
Yu, X. Y.

Publication title:

Java/Jini Technologies and High-Performance Pervasive Computing

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4863

Pub. Year:

2002

Page(from):

138

Page(to):

142

Pages:

5

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446428 [0819446424]

Language:

English

Call no.:

P63600/4863

Type:

Conference Proceedings

Details

TDL ID:	ZA00012708
Series ID:	PA00000029
Conf. info. (Name):	Convergence of IT and Communications : Java/Jini Technologies and High-Performance Pervasive Computing
Conf. info. (Number):	2002
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2002.07.30-2002.08.01

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