Precision shaping, assembly, and metrology of foil optics for x-ray reflection gratings

Precision shaping, assembly, and metrology of foil optics for x-ray reflection gratings

Author(s):

Forest, C.R. ( Massachusetts Institute of Technology(USA) )

Kahn, S.M. ( Columbia Astrophysics Lab.(USA) )

Golini, D. ( QED Technologies, Inc.(USA) )

5 more

Publication title:

X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4851

Pub. Year:

2003

Vol.:

Part One

Page(from):

538

Page(to):

548

Pages:

11

Pub. info.:

Bellingham WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446305 [0819446300]

Language:

English

Call no.:

P63600/4851

Type:

Conference Proceedings

Details

TDL ID:	ZA00012694
Series ID:	PA00000029
Conf. info. (Name):	Astronomical Telescopes and Instrumentation : X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
Conf. info. (Number):	2002
Conf. info. (Venue):	Waikoloa, Hawaii, USA
Conf. info. (Date):	2002.08.24-2008.08.28

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