Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI
- Author(s):
- Leveque, S.A. ( European Southern Observatory (Germany) )
- Wilhelm, R.
- Salvade, Y. ( Institute of Microtechnology/Univ. de Neuchatel (Switzerland) )
- Scherler, O.
- Daendliker, R.
- Publication title:
- Interferometry for Optical Astronomy II
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4838
- Pub. Year:
- 2003
- Vol.:
- Part Two
- Page(from):
- 983
- Page(to):
- 994
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819446176 [0819446173]
- Language:
- English
- Call no.:
- P63600/4838
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Metrology for phase-referenced imaging and narrow-angle astrometry with the VLTI
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Shape measurements of a segmented mirror with nanometer accuracy: the APE internal metrology [6267-86]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Calibration of systematic optical path differences for the Very Large Telescope Interferometer (VLTI)
SPIE-The International Society for Optical Engineering |
ESA Publications Division |