MIDI scientific and technical observing modes
- Author(s):
Bakker, E.J. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Leinert, C. ( Max-Planck-Institut fuer Astronomie (Germany) ) Jaffe, W. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Graser, U. ( Max-Planck-Institut fuer Astronomie (Germany) ) Percheron, I. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Chesneau, O. ( Max-Planck-Institut fuer Astronomie (Germany) ) Meisner, J.A. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Cotton, W.D. ( NRAO (USA) ) de Jong, J. ( Leiden Observatory/Univ. Leiden (Netherlands) ) Pel, J.-W. ( ASTRON (Netherlands) ) Glazenborg-Kluttig, A.W. ( ASTRON (Netherlands) ) Perrin, G.S. ( Observatoire de Paris-Meudon (France) ) Przygodda, F. ( Max-Planck-Institut fuer Astronomie (Germany) ) - Publication title:
- Interferometry for Optical Astronomy II
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4838
- Pub. Year:
- 2003
- Vol.:
- Part Two
- Page(from):
- 905
- Page(to):
- 916
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819446176 [0819446173]
- Language:
- English
- Call no.:
- P63600/4838
- Type:
- Conference Proceedings
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