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MIDI scientific and technical observing modes

Author(s):
Bakker, E.J. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Leinert, C. ( Max-Planck-Institut fuer Astronomie (Germany) )
Jaffe, W. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Graser, U. ( Max-Planck-Institut fuer Astronomie (Germany) )
Percheron, I. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Chesneau, O. ( Max-Planck-Institut fuer Astronomie (Germany) )
Meisner, J.A. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Cotton, W.D. ( NRAO (USA) )
de Jong, J. ( Leiden Observatory/Univ. Leiden (Netherlands) )
Pel, J.-W. ( ASTRON (Netherlands) )
Glazenborg-Kluttig, A.W. ( ASTRON (Netherlands) )
Perrin, G.S. ( Observatoire de Paris-Meudon (France) )
Przygodda, F. ( Max-Planck-Institut fuer Astronomie (Germany) )
8 more
Publication title:
Interferometry for Optical Astronomy II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4838
Pub. Year:
2003
Vol.:
Part Two
Page(from):
905
Page(to):
916
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446176 [0819446173]
Language:
English
Call no.:
P63600/4838
Type:
Conference Proceedings

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